Even the most sophisticated converters can find it challenging to measure color on flexible film substrates. For some types of films, the orientation of the measurement instrument relative to the film’s extrusion direction can impact results. With the eXact Xp, X-Rite has addressed this challenge, introducing special enhancements that help users accurately and consistently measure on a variety of film substrates, including lamination materials and base structures.
The X-Rite eXact Xp supports the measurement modes M0, M1, M2 and has all of the same features as the other devices in the eXact Family of spectrophotometers, including X-Rite eXact Scan. It fully supports ISO color measurement standards and measurements are compatible with common measurement modes of the standard eXact on printed materials. The eXact Xp is also supported with existing eXact Family software and applications.
Grand Rapids, MI, USA